-40%
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
$ 6124.8
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Description
Jeol JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDXUSED, UNABLE TO TEST, AVAILABLE FOR INSPECTION.
INCLUDES: NORAN SYSTEMS EDX MODEL 700P128425
SEIKO SEKI TURBO PUMP, MANUALS, ALL CABLES
FOB OUR DOCK IN TEMPLE, TEXAS 76504, WE PREFER THAT BUYER ARRANGE FOR SHIPPING
CURRENTLY SKIDDED, CRATING IS EXTRA
LOGAN TECHNOLOGIES, LP 2547602424